A Fourier Synthesis Method of X-Ray Diffraction Profile Analysis for Determination of Grain Size and Microdistortion

Li Huarui; Meng Qingen; Di Xiuxuan

doi:10.13374/j.issn1001-053x.1985.01.020

Volume 7 Issue 1

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Li Huarui, Meng Qingen, Di Xiuxuan. A Fourier Synthesis Method of X-Ray Diffraction Profile Analysis for Determination of Grain Size and Microdistortion[J]. Chinese Journal of Engineering, 1985, 7(1): 66-72. doi: 10.13374/j.issn1001-053x.1985.01.020

Citation:

Li Huarui, Meng Qingen, Di Xiuxuan. A Fourier Synthesis Method of X-Ray Diffraction Profile Analysis for Determination of Grain Size and Microdistortion[J]. Chinese Journal of Engineering, 1985, 7(1): 66-72. doi: 10.13374/j.issn1001-053x.1985.01.020

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A Fourier Synthesis Method of X-Ray Diffraction Profile Analysis for Determination of Grain Size and Microdistortion

doi: 10.13374/j.issn1001-053x.1985.01.020

Available Online: 2021-10-29

Abstract

Abstract

This article put forward a Fourier synthesis method of X-ray diffraction profile analysis for determination of grain size and microdistor-tion. Comparing with the, other existing methods, the hypotheses applied in this method is minimum.